DocumentCode
1139674
Title
Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques
Author
Collantes, Juan-Mari ; Pollard, Roger D. ; Sayed, Mohamed
Author_Institution
Electr. & Electron. Dept., Univ. of the Basque Country, Bilbao, Spain
Volume
51
Issue
6
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
1150
Lastpage
1156
Abstract
Device mismatch seriously degrades accuracy in noise figure characterization. The suitability of corrections to the gain definitions for a more precise noise figure evaluation for mismatched devices is investigated and compared to classical techniques. The effects of device mismatch on the noise figure of the noise-meter receiver and its impact on the final accuracy are analyzed.
Keywords
electric noise measurement; DUT mismatch; Y-factor technique; gain; noise figure measurement; noise-meter receiver; Circuit noise; Degradation; Gain measurement; Impedance; Mobile communication; Noise figure; Noise measurement; Power measurement; Temperature measurement; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2002.808015
Filename
1177905
Link To Document