Title :
Proton energy dependence of the light output in gallium nitride light-emitting diodes
Author :
Khanna, Shyam M. ; Estan, Diego ; Erhardt, Lorne S. ; Houdayer, Alain ; Carlone, Cosmo ; Ionascut-Nedelcescu, Anca ; Messenger, Scott R. ; Walters, Robert J. ; Summers, Geoffrey P. ; Warner, Jeffrey H. ; Jun, Insoo
Author_Institution :
Defence Res. Establ. Ottawa, Ont., Canada
Abstract :
Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1×1011 to 1×1015 cm-2. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.
Keywords :
III-V semiconductors; energy loss of particles; gallium compounds; light emitting diodes; proton effects; quantum well devices; wide band gap semiconductors; 1/E relationship; 293 to 298 K; CREE Model C430-DH85; GaN; GaN-based blue LEDs; Rose and Barnes theory; damage constant; gallium nitride; light output degradation curves; nonionizing energy loss calculations; nuclear interactions; optoelectronics; proton energy dependence; quantum-well light-emitting diodes; radiation damage; room temperature; Atomic measurements; Degradation; Energy loss; Gallium nitride; III-V semiconductor materials; Laboratories; Light emitting diodes; Physics; Protons; Temperature measurement; Blue LEDs; NIEL; energy dependence; gallium nitride; light emission degradation; non-ionizing energy loss; optoelectronics; proton; quantum-well light-emitting diodes; radiation damage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.835097