Title :
A framework for the characterization and verification of embedded phase-locked loops
Author :
Egan, Tom ; Mourad, Samiha
Author_Institution :
Santa Clara Univ., CA, USA
fDate :
12/1/2002 12:00:00 AM
Abstract :
With the increasing use of phase-locked loops (PLLs) embedded in FPGAs, ASICs, and system-on-chip (SOC), there is a growing need for methods to verify their operation. This paper describes a general and organized list that includes tests for lock, jitter, stability, and modulation response. The list is offered as a guide to the verification and testing of an embedded PLL. For that reason, it is presented in such a way as to allow the reader to determine the extent to which the verification will be carried out. The tests are covered from the easiest to the most complicated to perform, with the amount of information gathered increasing along with the complexity of the test.
Keywords :
circuit stability; integrated circuit noise; integrated circuit testing; jitter; phase locked loops; ASICs; FPGAs; SOC; complexity; embedded phase-locked loops; jitter; modulation response; stability; testing; verification; Circuit testing; Clocks; Delay; Jitter; Performance evaluation; Phase locked loops; Production; Stability; System-on-a-chip; Voltage-controlled oscillators;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.807983