• DocumentCode
    1139796
  • Title

    A framework for the characterization and verification of embedded phase-locked loops

  • Author

    Egan, Tom ; Mourad, Samiha

  • Author_Institution
    Santa Clara Univ., CA, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1234
  • Lastpage
    1239
  • Abstract
    With the increasing use of phase-locked loops (PLLs) embedded in FPGAs, ASICs, and system-on-chip (SOC), there is a growing need for methods to verify their operation. This paper describes a general and organized list that includes tests for lock, jitter, stability, and modulation response. The list is offered as a guide to the verification and testing of an embedded PLL. For that reason, it is presented in such a way as to allow the reader to determine the extent to which the verification will be carried out. The tests are covered from the easiest to the most complicated to perform, with the amount of information gathered increasing along with the complexity of the test.
  • Keywords
    circuit stability; integrated circuit noise; integrated circuit testing; jitter; phase locked loops; ASICs; FPGAs; SOC; complexity; embedded phase-locked loops; jitter; modulation response; stability; testing; verification; Circuit testing; Clocks; Delay; Jitter; Performance evaluation; Phase locked loops; Production; Stability; System-on-a-chip; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.807983
  • Filename
    1177917