Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Author

Cimino, Mikaël ; Lapuyade, Hervé ; Deval, Yann ; Taris, Thierry ; Bégueret, Jean-Baptiste

Author_Institution

Univ. of Bordeaux 1, Talence

Volume

43

Issue

5

fYear

2008

fDate

5/1/2008 12:00:00 AM

Firstpage

1187

Lastpage

1194

Abstract

A self-testable and highly reliable low noise amplifier designed in 0.13 m CMOS technology is presented in this paper. This reliable LNA could be used to design the front-end of critical nodes in wireless local area networks to ensure data transmission. The LNA test, based on a built-in self test methodology, monitors its behavior. The test circuit is composed of one sensor and one biasing voltage sensor, and it offers high fault coverage. The high reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has RF characteristics suitable for 802.11b/g applications. Parametric faults are injected and detected to demonstrate the efficiency of the BIST circuitry. Thanks to the switching on redundant blocks, performances are maintained and hence this proves the reliability of the methodology proposed.

Keywords

CMOS analogue integrated circuits; built-in self test; low noise amplifiers; CMOS LNA; biasing voltage sensor; built-in self test methodology; frequency 2.45 GHz; low noise amplifier; voltage 0.9 V; Automatic testing; Built-in self-test; CMOS technology; Circuit faults; Circuit noise; Circuit testing; Low-noise amplifiers; Sensor phenomena and characterization; Voltage; Wireless LAN; Built-in current sensor; CMOS VLSI; RF low noise amplifier; built-in self test; design for test; low voltage; reliable design;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2008.920354

Filename

4494646