Title : 
Symmetry, Automorphism, and Test
         
        
            Author : 
Turcat, Claudine ; Verdillon, André
         
        
            Author_Institution : 
CEPHAG, Equipe de Recherche Associée du C.N.R.S.
         
        
        
        
            fDate : 
4/1/1979 12:00:00 AM
         
        
        
        
            Abstract : 
This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.
         
        
            Keywords : 
Automorphism; faults; symmetry; test.; Graph theory; Logic; Testing; Automorphism; faults; symmetry; test.;
         
        
        
            Journal_Title : 
Computers, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TC.1979.1675354