Title :
Symmetry, Automorphism, and Test
Author :
Turcat, Claudine ; Verdillon, André
Author_Institution :
CEPHAG, Equipe de Recherche Associée du C.N.R.S.
fDate :
4/1/1979 12:00:00 AM
Abstract :
This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.
Keywords :
Automorphism; faults; symmetry; test.; Graph theory; Logic; Testing; Automorphism; faults; symmetry; test.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675354