• DocumentCode
    1139855
  • Title

    Comments on the reliability of GaAs Stripe-Geometry juntion lasers

  • Author

    Ripper, José E.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
  • Volume
    6
  • Issue
    6
  • fYear
    1970
  • fDate
    6/1/1970 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    373
  • Abstract
    Experiments with stripe-geometry lasers show that Byer\´s results for degradation of pulsed diodes can not be generalized to CW conditions. Diodes subjected to CW injection-current density of 8 \\times 10^{3} A/cm2show very little degradation after close to 1000 hours of operation at room temperature.
  • Keywords
    Current density; Degradation; Diodes; Gallium arsenide; Heat sinks; Optical pulses; Power lasers; Pulse measurements; Temperature; Testing;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1970.1076468
  • Filename
    1076468
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1139855