DocumentCode
1139859
Title
Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions
Author
Buchner, Stephen ; McMorrow, Dale ; Poivey, Christian ; Howard, James, Jr. ; Boulghassoul, Younes ; Massengill, Lloyd W. ; Pease, Ron ; Savage, Mark
Author_Institution
QSS Group Inc., Seabrook, MD, USA
Volume
51
Issue
5
fYear
2004
Firstpage
2776
Lastpage
2781
Abstract
A comparison of single-event transients (SETs) from heavy-ion and pulsed-laser irradiation of the LM124 operational amplifier shows good agreement for different voltage configurations. The agreement is illustrated by comparing both individual transient shapes and plots of transient amplitude versus width.
Keywords
bipolar transistors; ion beam effects; laser beam effects; operational amplifiers; LM124 operational amplifier; SET sensitive transistors; heavy-ion beam irradiation; linear bipolar devices; pulse shapes; pulsed-laser irradiation; single-event transients; transient amplitude; transient shapes; voltage configurations; Circuit testing; Ion beams; Laser beams; Operational amplifiers; Optical pulse generation; Optical pulse shaping; Optical pulses; Pulse amplifiers; Shape; Voltage; Heavy ions; SETs; linear devices; pulse shapes; pulsed laser; single-event transients;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.835111
Filename
1344416
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