Title :
Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions
Author :
Buchner, Stephen ; McMorrow, Dale ; Poivey, Christian ; Howard, James, Jr. ; Boulghassoul, Younes ; Massengill, Lloyd W. ; Pease, Ron ; Savage, Mark
Author_Institution :
QSS Group Inc., Seabrook, MD, USA
Abstract :
A comparison of single-event transients (SETs) from heavy-ion and pulsed-laser irradiation of the LM124 operational amplifier shows good agreement for different voltage configurations. The agreement is illustrated by comparing both individual transient shapes and plots of transient amplitude versus width.
Keywords :
bipolar transistors; ion beam effects; laser beam effects; operational amplifiers; LM124 operational amplifier; SET sensitive transistors; heavy-ion beam irradiation; linear bipolar devices; pulse shapes; pulsed-laser irradiation; single-event transients; transient amplitude; transient shapes; voltage configurations; Circuit testing; Ion beams; Laser beams; Operational amplifiers; Optical pulse generation; Optical pulse shaping; Optical pulses; Pulse amplifiers; Shape; Voltage; Heavy ions; SETs; linear devices; pulse shapes; pulsed laser; single-event transients;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.835111
