Title :
Diagnosis of Faults in Modular Trees
Author :
Gray, F. Gail ; Shih, Lionel C C ; Thompson, Richard A.
Author_Institution :
Department of Electrical Engineering, Virginia Polytechnic Institute and State University
fDate :
5/1/1979 12:00:00 AM
Abstract :
Diagnosis of stuck-at faults (s-a-f´s) in modular trees is studied. Detection conditions for each distinguishable s-a-f in a module are derived. For single s-a-f´s, the detection conditions are easily partitioned to achieve fault location by performing a small number of additional tests. A multiple s-a-f that produces the same test result as a single s-a-f can be located by applying additional tests whose number grows with the tree depth. All other multiple s-a-f´s are detected but cannot be located. In this paper location algorithms for combinational modular trees are presented in detail. They are then modified to locate faults in modular trees which realize arbitrary definite machines. Since a pair of these tree structures can be connected to realize arbitrary sequential machines, the results derived here are useful in diagnosing sequential machines. The ability to diagnose faults, combined with the fact that the function of the tree is easily altered, makes this structure attractive in reconfiguration applications. In particular, application to array processors is suggested.
Keywords :
Cellular networks; design for ease of diagnosis; diagnosis algorithms; fault detection; fault diagnosis; fault location; modular design; multiple faults; single faults; stuck-at faults; tree structures.; Algorithm design and analysis; Circuit faults; Fault detection; Fault diagnosis; Fault location; Input variables; Performance evaluation; Redundancy; Testing; Tree data structures; Cellular networks; design for ease of diagnosis; diagnosis algorithms; fault detection; fault diagnosis; fault location; modular design; multiple faults; single faults; stuck-at faults; tree structures.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675364