DocumentCode
1139919
Title
InGaAs-Capped InAs–GaAs Quantum-Dot Infrared Photodetectors Operating in the Long-Wavelength Infrared Range
Author
Lin, Wei-Hsun ; Tseng, Chi-Che ; Chao, Kuang-Ping ; Mai, Shu-Cheng ; Lin, Shih-Yen ; Wu, Meng-Chyi
Author_Institution
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
21
Issue
18
fYear
2009
Firstpage
1332
Lastpage
1334
Abstract
A ten-period InAs-GaAs quantum-dot infrared photodetector (QDIP) with 8-nm In0.15Ga0.85 As capping layer grown after quantum-dot (QD) deposition is investigated. With reduced InAs QD coverage down to 2.0 mono-layers, responses at 10.4 and 8.4 mum are observed for the device under positive and negative biases, respectively. The phenomenon is attributed to the large Stark effect resulted from the asymmetric band diagrams of the device under different voltage polarities. The demonstration of long-wavelength infrared detections with the simple structures of the InGaAs-capped QDIP is advantageous for the development of multicolor QDIP focal-plane arrays.
Keywords
III-V semiconductors; Stark effect; focal planes; gallium arsenide; indium compounds; infrared detectors; photodetectors; semiconductor quantum dots; In0.15Ga0.85As-InAs-GaAs; Stark effect; asymmetric band diagrams; capping layer; long-wavelength infrared detections; multicolor QDIP focal-plane arrays; quantum-dot deposition; quantum-dot infrared photodetector; size 8 nm; voltage polarity; Quantum-dot infrared photodetectors (QDIPs);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2009.2026630
Filename
5166511
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