• DocumentCode
    1139993
  • Title

    CMOS Transconductors With Continuous Tuning Using FGMOS Balanced Output Current Scaling

  • Author

    Lopez-Martin, Antonio J. ; Ramírez-Angulo, Jaime ; Carvajal, Ramón González ; Acosta, Lucia

  • Author_Institution
    Public Univ. of Navarra, Pamplona
  • Volume
    43
  • Issue
    5
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    1313
  • Lastpage
    1323
  • Abstract
    A technique to achieve highly linear scaling of differential currents in CMOS technology is presented. It is based on operation in weak or moderate inversion, and features performance improvements over previous proposals aimed to the same goal, like reduced supply voltage requirements, increased power efficiency, and avoidance of bulk effect. As an example, this technique is applied to attain continuous tuning for two novel voltage-to-current converters, achieving highly linear programmable transconductance over a rail-to-rail input range. Both implementations fabricated in a 0.5-mum CMOS technology using a dual supply of plusmn1.5 V achieve a THD of -60 dB with differential input swings of 6 Vpp (i.e., twice the supply voltage). The area and power consumption are 0.12 mm2 and 2.6 mW for the first implementation and 0.11 mm2 and 2.2 mW for the second one, respectively.
  • Keywords
    CMOS integrated circuits; convertors; CMOS transconductors; FGMOS balanced output current scaling; bulk effect avoidance; continuous tuning; differential currents; linear programmable transconductance; power efficiency; size 0.5 mum; supply voltage requirements; voltage 6 V; voltage-to-current converters; CMOS technology; Circuits; Degradation; Energy consumption; Filters; Linearity; Resistors; Transconductance; Transconductors; Voltage; Analog CMOS circuits; Gm-C filters; continuous-time filters; floating-gate MOS (FGMOS); floating-gate MOSFET; low-voltage CMOS circuits; moderate inversion; operational transconductance amplifier; transconductors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2008.920333
  • Filename
    4494665