Title :
Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults
Author :
Koren, Israel ; Su, Stephen Y H
Author_Institution :
Department of Electrical Engineering-Systems, University of Southern California
fDate :
7/1/1979 12:00:00 AM
Abstract :
It is well known that static redundancy techniques are very efficient against intermittent (transient) faults which constitute a large portion of logic faults in digital systems. However, very little theoretical work has been done in evaluating the reliability of modular redundancy systems which are subject to intermittent malfunction occurrences. In this paper we present a statistical model for intermittent faults and use it to analyze the reliability of NMR systems in mixed intermittent and permanent fault environments.
Keywords :
Digital system; intermittent fault; modular redundancy; permanent fault; reliability; Availability; Computer science; Digital systems; Fault diagnosis; Fault tolerant systems; Logic; Nuclear magnetic resonance; Redundancy; Reliability theory; Stochastic processes; Digital system; intermittent fault; modular redundancy; permanent fault; reliability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675397
