• DocumentCode
    1140219
  • Title

    Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults

  • Author

    Koren, Israel ; Su, Stephen Y H

  • Author_Institution
    Department of Electrical Engineering-Systems, University of Southern California
  • Issue
    7
  • fYear
    1979
  • fDate
    7/1/1979 12:00:00 AM
  • Firstpage
    514
  • Lastpage
    520
  • Abstract
    It is well known that static redundancy techniques are very efficient against intermittent (transient) faults which constitute a large portion of logic faults in digital systems. However, very little theoretical work has been done in evaluating the reliability of modular redundancy systems which are subject to intermittent malfunction occurrences. In this paper we present a statistical model for intermittent faults and use it to analyze the reliability of NMR systems in mixed intermittent and permanent fault environments.
  • Keywords
    Digital system; intermittent fault; modular redundancy; permanent fault; reliability; Availability; Computer science; Digital systems; Fault diagnosis; Fault tolerant systems; Logic; Nuclear magnetic resonance; Redundancy; Reliability theory; Stochastic processes; Digital system; intermittent fault; modular redundancy; permanent fault; reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675397
  • Filename
    1675397