DocumentCode
1140289
Title
Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs
Author
Samudrala, Praveen Kumar ; Ramos, Jeremy ; Katkoori, Srinivas
Author_Institution
Space Micro Inc., San Diego, CA, USA
Volume
51
Issue
5
fYear
2004
Firstpage
2957
Lastpage
2969
Abstract
We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC´91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity.
Keywords
benchmark testing; buffer circuits; combinational circuits; field programmable gate arrays; radiation hardening (electronics); redundancy; tolerance analysis; MCNC´91 benchmarks; SEU fault insertion simulator; SEU sensitive subcircuits; STMR based single-event upset tolerant synthesis; Xilinx Virtex FPGA; combinational circuit hardening; design technique; field programmable gate array; hardened circuit; readback; reconfiguration feature; selective triple modular redundancy; signal probabilities; tristate buffers; very high SEU immunity; voter circuits; Benchmark testing; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Field programmable gate arrays; Redundancy; Signal synthesis; Single event upset; FPGA; Field programmable gate array; SEU; TMR; single-event upset; triple modular redundancy;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.834955
Filename
1344451
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