• DocumentCode
    1140289
  • Title

    Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs

  • Author

    Samudrala, Praveen Kumar ; Ramos, Jeremy ; Katkoori, Srinivas

  • Author_Institution
    Space Micro Inc., San Diego, CA, USA
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2957
  • Lastpage
    2969
  • Abstract
    We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC´91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity.
  • Keywords
    benchmark testing; buffer circuits; combinational circuits; field programmable gate arrays; radiation hardening (electronics); redundancy; tolerance analysis; MCNC´91 benchmarks; SEU fault insertion simulator; SEU sensitive subcircuits; STMR based single-event upset tolerant synthesis; Xilinx Virtex FPGA; combinational circuit hardening; design technique; field programmable gate array; hardened circuit; readback; reconfiguration feature; selective triple modular redundancy; signal probabilities; tristate buffers; very high SEU immunity; voter circuits; Benchmark testing; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Field programmable gate arrays; Redundancy; Signal synthesis; Single event upset; FPGA; Field programmable gate array; SEU; TMR; single-event upset; triple modular redundancy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.834955
  • Filename
    1344451