DocumentCode :
1140395
Title :
Surface parametrization and curvature measurement of arbitrary 3-D objects: five practical methods
Author :
Stokely, Ernest M. ; Wu, Shang You
Author_Institution :
Dept. of Biomed. Eng., Alabama Univ., Birmingham, AL, USA
Volume :
14
Issue :
8
fYear :
1992
fDate :
8/1/1992 12:00:00 AM
Firstpage :
833
Lastpage :
840
Abstract :
Curvature sampling of arbitrary, fully described 3-D objects (e.g. tomographic medical images) is difficult because of surface patch parameterization problems. Five practical solutions are presented and characterized-the Sander-Zucker approach, two novel methods based on direct surface mapping, a piecewise linear manifold technique, and a turtle geometry method. One of the new methods, called the cross patch (CP) method, is shown to be very fast, robust in the presence of noise, and is always based on a proper surface parameterization, provided the perturbations of the surface over the patch neighborhood are isotropically distributed
Keywords :
pattern recognition; picture processing; 3D images; Sander-Zucker approach; cross patch; curvature measurement; curvature sampling; direct surface mapping; picture processing; piecewise linear manifold technique; shape recognition; surface patch parameterization; turtle geometry method; Biomedical engineering; Biomedical imaging; Biomedical measurements; Computer vision; Image analysis; Image sampling; Inspection; Object recognition; Shape; Surface emitting lasers;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.149594
Filename :
149594
Link To Document :
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