DocumentCode :
1140413
Title :
Author´s Reply
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Laboratories
Issue :
8
fYear :
1979
Firstpage :
581
Lastpage :
581
Abstract :
P. B. Schneck is right in pointing out that maximum fan-in will lead to a more conservative estimate of the number of random patterns needed for complete testing. It is, however, useful to compare these estimates with practical cases. We will consider two examples.
Keywords :
Arithmetic; Circuit faults; Circuit simulation; Circuit testing; Instruments; Logic; Probability; Random number generation; Test pattern generators; Upper bound;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1979.1675416
Filename :
1675416
Link To Document :
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