DocumentCode
1140413
Title
Author´s Reply
Author
Agrawal, Vishwani D.
Author_Institution
Bell Laboratories
Issue
8
fYear
1979
Firstpage
581
Lastpage
581
Abstract
P. B. Schneck is right in pointing out that maximum fan-in will lead to a more conservative estimate of the number of random patterns needed for complete testing. It is, however, useful to compare these estimates with practical cases. We will consider two examples.
Keywords
Arithmetic; Circuit faults; Circuit simulation; Circuit testing; Instruments; Logic; Probability; Random number generation; Test pattern generators; Upper bound;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1979.1675416
Filename
1675416
Link To Document