Optimum test points selection in analogue-circuit diagnosis with graphic fault detection and isolation information record

This paper proposes two new algorithms to locate the optimal test-points set in analogue circuit. These proposed methods make good use of the concept of fault-pair, and establish the bipartite network for fault detection and isolation information (FDI) coding. It also makes good use of network parameters including edge weights and cluster coefficients. The effectiveness of the algorithms is tested in an analogue circuit benchmark. In addition, the statistical experiment is used when compared with some previous methods based on fault dictionary technology. All these results show that the proposed test-points selection (TPS) method is indeed to minimize the size of the test-points set.