DocumentCode
1140864
Title
A Simplified Superior Floating-Body/Gate DRAM Cell
Author
Lu, Zhichao ; Fossum, Jerry G. ; Yang, Ji-Woon ; Harris, H. Rusty ; Trivedi, Vishal P. ; Chu, Min ; Thompson, Scott E.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL
Volume
30
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
282
Lastpage
284
Abstract
The basic concept of a simplified and easily manufacturable version of the two-transistor floating-body/gate DRAM cell (FBGC) is proposed and demonstrated via simulation and fabrication/experiment. Converting the charge-storage transistor (T1) to a gated diode enables easy and direct connection of its body to the gate of the sensing transistor in conventional planar SOI CMOS and in FinFET technologies, and also reduces the cell size. Numerical simulations show that the new cell can yield a much better signal margin and dissipate much less power than the one-transistor floating-body DRAM cells currently being assessed. A FinFET-based prototype of the new cell provides experimental corroboration of these features.
Keywords
CMOS digital integrated circuits; DRAM chips; MOSFET; silicon-on-insulator; FinFET technologies; charge-storage transistor; conventional planar SOI CMOS technologies; gated diode; sensing transistor; two-transistor floating-body-gate DRAM cell; Capacitorless DRAM; FinFETs; GIDL current; SOI MOSFETs; charge dynamics; floating-body effects; gated diode;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2012006
Filename
4773235
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