• DocumentCode
    1140864
  • Title

    A Simplified Superior Floating-Body/Gate DRAM Cell

  • Author

    Lu, Zhichao ; Fossum, Jerry G. ; Yang, Ji-Woon ; Harris, H. Rusty ; Trivedi, Vishal P. ; Chu, Min ; Thompson, Scott E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL
  • Volume
    30
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    282
  • Lastpage
    284
  • Abstract
    The basic concept of a simplified and easily manufacturable version of the two-transistor floating-body/gate DRAM cell (FBGC) is proposed and demonstrated via simulation and fabrication/experiment. Converting the charge-storage transistor (T1) to a gated diode enables easy and direct connection of its body to the gate of the sensing transistor in conventional planar SOI CMOS and in FinFET technologies, and also reduces the cell size. Numerical simulations show that the new cell can yield a much better signal margin and dissipate much less power than the one-transistor floating-body DRAM cells currently being assessed. A FinFET-based prototype of the new cell provides experimental corroboration of these features.
  • Keywords
    CMOS digital integrated circuits; DRAM chips; MOSFET; silicon-on-insulator; FinFET technologies; charge-storage transistor; conventional planar SOI CMOS technologies; gated diode; sensing transistor; two-transistor floating-body-gate DRAM cell; Capacitorless DRAM; FinFETs; GIDL current; SOI MOSFETs; charge dynamics; floating-body effects; gated diode;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2012006
  • Filename
    4773235