DocumentCode :
1140891
Title :
Performance Comparison Between p-i-n Tunneling Transistors and Conventional MOSFETs
Author :
Koswatta, Siyuranga O. ; Lundstrom, Mark S. ; Nikonov, Dmitri E.
Author_Institution :
IBM T J. Watson Res. Center, Yorktown Heights, NY
Volume :
56
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
456
Lastpage :
465
Abstract :
In this paper, we present a detailed performance comparison between conventional n-i-n MOSFET transistors and tunneling field-effect transistors (TFETs) based on the p-i-n geometry, using semiconducting carbon nanotubes as the model channel material. Quantum-transport simulations are performed using the nonequilibrium Green´s function formalism considering realistic phonon-scattering and band-to-band tunneling mechanisms. Simulations show that TFETs have a smaller quantum capacitance at most gate biases. Despite lower on-current, they can switch faster in a range of on/off-current ratios. Switching energy for TFETs is observed to be fundamentally smaller than that for MOSFETs, leading to lower dynamic power dissipation. Furthermore, the beneficial features of TFETs are retained with different bandgap materials. These reasons suggest that the p-i-n TFET is well suited for low-power applications.
Keywords :
Green´s function methods; MOSFET; carbon nanotubes; semiconductor materials; tunnel transistors; C; MOSFET; band-to-band tunneling; dynamic power dissipation; nonequilibrium Green function; p-i-n tunneling transistors; quantum capacitance; quantum-transport simulations; realistic phonon-scattering; semiconducting carbon nanotubes; tunneling field-effect transistors; CNTFETs; Carbon nanotubes; FETs; Geometry; MOSFETs; Organic materials; PIN photodiodes; Semiconductivity; Solid modeling; Tunneling; Band-to-band tunneling (BTBT); MOSFET; carbon nanotube (CNT); phonon scattering; subthreshold swing; tunneling field-effect transistor (TFET);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2008.2011934
Filename :
4773237
Link To Document :
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