• DocumentCode
    1140891
  • Title

    Performance Comparison Between p-i-n Tunneling Transistors and Conventional MOSFETs

  • Author

    Koswatta, Siyuranga O. ; Lundstrom, Mark S. ; Nikonov, Dmitri E.

  • Author_Institution
    IBM T J. Watson Res. Center, Yorktown Heights, NY
  • Volume
    56
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    456
  • Lastpage
    465
  • Abstract
    In this paper, we present a detailed performance comparison between conventional n-i-n MOSFET transistors and tunneling field-effect transistors (TFETs) based on the p-i-n geometry, using semiconducting carbon nanotubes as the model channel material. Quantum-transport simulations are performed using the nonequilibrium Green´s function formalism considering realistic phonon-scattering and band-to-band tunneling mechanisms. Simulations show that TFETs have a smaller quantum capacitance at most gate biases. Despite lower on-current, they can switch faster in a range of on/off-current ratios. Switching energy for TFETs is observed to be fundamentally smaller than that for MOSFETs, leading to lower dynamic power dissipation. Furthermore, the beneficial features of TFETs are retained with different bandgap materials. These reasons suggest that the p-i-n TFET is well suited for low-power applications.
  • Keywords
    Green´s function methods; MOSFET; carbon nanotubes; semiconductor materials; tunnel transistors; C; MOSFET; band-to-band tunneling; dynamic power dissipation; nonequilibrium Green function; p-i-n tunneling transistors; quantum capacitance; quantum-transport simulations; realistic phonon-scattering; semiconducting carbon nanotubes; tunneling field-effect transistors; CNTFETs; Carbon nanotubes; FETs; Geometry; MOSFETs; Organic materials; PIN photodiodes; Semiconductivity; Solid modeling; Tunneling; Band-to-band tunneling (BTBT); MOSFET; carbon nanotube (CNT); phonon scattering; subthreshold swing; tunneling field-effect transistor (TFET);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2011934
  • Filename
    4773237