DocumentCode :
1140965
Title :
Nonlinear amplification in a second-harmonic waveguide free-electron laser
Author :
Zhong, Xiehe ; Kong, Michael G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Loughborough Univ., Leicestershire, UK
Volume :
30
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
2059
Lastpage :
2065
Abstract :
This paper describes the results of numerical simulation of second-harmonic waveguide free-electron lasers (FELs) from the small-signal regime to the large-signal regime. Aimed at reducing the size and hence the cost of compact waveguide FELs operated from the microwave to the far infrared, these unconventional waveguide FELs can substantially decrease the minimum electron energy required for strong FEL radiation at a given frequency while increasing the small-signal gain. This contribution focuses on their saturation behaviors, taking into consideration variation in wiggler field and electron-energy spread. Depending on the roundtrip power loss within the FEL cavity and the initial electron-energy spread, the computed relationship between interaction gain and in-cavity power can be used to maximize the output power at a given electron current. Furthermore, it is found that gain degradation due to electron-energy spread remains relatively unchanged regardless of radiation power and wiggler field.
Keywords :
digital simulation; free electron lasers; optical harmonic generation; waveguide lasers; electron current; electron-energy spread; gain degradation; large-signal regime; minimum electron energy; nonlinear amplification; numerical simulation; output power maximisation; radiation power; roundtrip power loss; saturation behaviors; second-harmonic waveguide free-electron laser; small-signal gain; small-signal regime; strong FEL radiation; wiggler field; Costs; Electron beams; Free electron lasers; Frequency; Masers; Numerical models; Power generation; Undulators; Waveguide components; Waveguide lasers;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2002.807507
Filename :
1178024
Link To Document :
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