Title :
Random numbers from metastability and thermal noise
Author :
Ranasinghe, D.C. ; Lim, D. ; Devadas, S. ; Abbott, D. ; Cole, P.H.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Adelaide, SA, Australia
Keywords :
CMOS digital integrated circuits; cryptography; random number generation; thermal noise; CMOS technology; metastability; pseudorandom number generators; random number generator; thermal noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20051559
