• DocumentCode
    1141226
  • Title

    Random numbers from metastability and thermal noise

  • Author

    Ranasinghe, D.C. ; Lim, D. ; Devadas, S. ; Abbott, D. ; Cole, P.H.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. of Adelaide, SA, Australia
  • Volume
    41
  • Issue
    16
  • fYear
    2005
  • Firstpage
    13
  • Lastpage
    14
  • Keywords
    CMOS digital integrated circuits; cryptography; random number generation; thermal noise; CMOS technology; metastability; pseudorandom number generators; random number generator; thermal noise;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20051559
  • Filename
    1497201
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1141226