Title :
Dual-Mode Logic for Function-Independent Fault Testing
Author :
Dasgupta, Sumit ; Hartmann, Carlos R P ; Rudolph, Luther D.
Author_Institution :
IBM Data Systems Division
Abstract :
This correspondence presents a oncept of function-independent testing of digital networks. It is based on the idea of dual-mode logic where the network is tested in one mode while the normal function of the network is performed in another mode, with neither mode interfering with the other. This correspondence simultaneously defines the structure of modules with the above characteristics such that combinational and sequential networks built with them can be tested with two and six function-independent tests, respectively.
Keywords :
Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults; Bonding; Circuit faults; Circuit testing; Fault detection; Hamming distance; Logic testing; Network-on-a-chip; Packaging; Performance evaluation; Sequential analysis; Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675500
