Title :
Analysis of the noise factor of an avalanche photodiode operated in charge-storage mode
Author :
Huang, Zhong-Shou
fDate :
9/1/1994 12:00:00 AM
Abstract :
A simple expression for the noise factor of an avalanche photodiode (APD) operating in a charge-storage mode is derived. Calculated results for a crystalline silicon APD suggest that input shot noise could be reduced by the sublinear light-transfer characteristics of the APD, which are in good agreement with experimental results
Keywords :
avalanche photodiodes; equivalent circuits; random noise; semiconductor device models; semiconductor device noise; silicon; APD noise; Si; avalanche photodiode; charge-storage mode; crystalline Si; input shot noise; noise factor; sublinear light-transfer characteristics; Avalanche photodiodes; Circuit noise; Electron tubes; Equivalent circuits; Image sensors; Noise reduction; Solid state circuits; Switches; Switching circuits; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
