DocumentCode :
1141445
Title :
Transient intensity noise of semiconductor lasers: experiments and comparison with theory
Author :
Czylwik, Andreas ; Eberle, Wolfgang
Author_Institution :
Tech. Hochschule Darmstadt, Inst. fuer Uebertragungstech., West Germany
Volume :
26
Issue :
2
fYear :
1990
fDate :
2/1/1990 12:00:00 AM
Firstpage :
225
Lastpage :
230
Abstract :
An experimental setup for the measurement of the nonstationary intensity fluctuations during the turn-on transient of semiconductor lasers is presented. Measurements are carried out and compared with simulations, which are based on rate equations with Langevin fluctuation functions. Good agreement between theory and measurements is found, and it is confirmed that the nonstationary intensity noise can be interpreted as timing jitter
Keywords :
electron device noise; functions; semiconductor junction lasers; Langevin fluctuation functions; nonstationary intensity fluctuations; rate equations; semiconductor laser noise; semiconductor lasers; timing jitter; transient intensity noise; turn-on transient; Equations; Fluctuations; Laser noise; Laser theory; Noise measurement; Optical noise; Optical pulse generation; Oscilloscopes; Sampling methods; Semiconductor device noise; Semiconductor lasers; Timing jitter;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.44953
Filename :
44953
Link To Document :
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