Title :
Reliability ratio based weighted bit-flipping decoding for low-density parity-check codes
Author :
Guo, F. ; Hanzo, L.
Author_Institution :
Sch. of Electr. and Comput. Sci., Univ. of Southampton, UK
Abstract :
A novel reliability ratio based weighted bit-flipping decoding scheme is proposed for low-density parity-check codes. A coding gain of 1 dB is achieved in comparison to the weighted bit-flipping scheme, when communicating over an AWGN channel, while maintaining the same decoding complexity.
Keywords :
AWGN channels; decoding; parity check codes; reliability theory; 1 dB; AWGN channel; coding gain; decoding complexity; low-density parity-check codes; reliability ratio; weighted bit-flipping decoding;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20046400
