DocumentCode
1141750
Title
A method for determination of microwave surface impedance of high-T c thick film and bulk superconductors
Author
Wu, Zhipeng ; Davis, Lionel E.
Author_Institution
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
Volume
43
Issue
4
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
532
Lastpage
535
Abstract
A resonator method is presented which enables R, and X8 to be determined as a function of temperature with the exclusion of the thermal expansion effect. Results for R, and X, are given for a bulk YBCO sample at 13 GHz over the range 15-190 K. Good agreement with the “enhanced” two-fluid model is found for λ(T), and λ=657 nm at 77 K
Keywords
barium compounds; electric impedance measurement; high-temperature superconductors; microwave measurement; surface conductivity; yttrium compounds; 13 GHz; 15 to 190 K; 657 nm; 77 K; YBCO sample; YBaCuO; bulk superconductors; cylindrical cavity; high-Tc thick film superconductor; microwave surface impedance; resonator method; surface reactance; surface resistance; temperature dependence; thermal expansion; two-fluid model; Electrical resistance measurement; Magnetic field measurement; Microwave theory and techniques; Superconductivity; Surface impedance; Surface resistance; Temperature; Thermal expansion; Thick films; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.310163
Filename
310163
Link To Document