Title :
Successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility
Author :
Sidhwa, Frank ; Moore, Fred ; Williams, Tad ; Matsuura, Daisuke
Author_Institution :
Boeing Co., Long Beach, CA, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
In today\´s world of constrained budgets, one of the problems the military faces is the challenge of trying to maintain organic maintenance capabilities. Historically, the US Air Force has desired to achieve an autonomous capability to maintain the equipment it uses. This has been achieved, traditionally, by setting-up three levels of maintenance: organizational; intermediate (back-shop); and depot. The I-level back-shops often utilize militarized automatic test equipment (ATE) and test program sets (TPSs) to test today\´s complex aircraft line replaceable units (LRUs). And even though this is still a cost-effective maintenance philosophy, it has become costly to develop militarized ATE. The Department of Defense (DoD) has been very active in trying to reduce the total ownership cost of ATE in the government inventory. One approach is to utilize commercial, instead of Mil-Spec, ATE. However, utilizing commercial ATE at an USAF back-shop is not without its tradeoffs and challenges as it represents a significant deviation from the way the USAF maintenance squadrons are accustomed to "doing business." This paper documents the current success story of replacing the legacy C-17 I-level ATE with a commercial ATE.
Keywords :
aerospace test facilities; aircraft maintenance; automatic test equipment; military aircraft; Air Force I; C-17 I-level ATE; Department of Defense; Mil-Spec; US Air Force; USAF maintenance squadron; aircraft equipment maintenance; aircraft line replaceable units; aircraft repair facility; automatic test equipment; back-shop; commercial ATE; cost-effective maintenance; depot maintenance; intermediate maintenance; militarized ATE; militarized equipment; organizational maintenance; test program sets; Aging; Automatic test equipment; Automatic testing; Business; Costs; Documentation; Government; Military aircraft; Procurement; Weapons;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
DOI :
10.1109/MAES.2004.1346846