DocumentCode :
1141901
Title :
Generic Fault Characterizations for Table Look-Up Coverage Bounding
Author :
Agarwal, Vinod K. ; Masson, Gerald M.
Author_Institution :
Department of Electrical Engineering, McGill University
Issue :
4
fYear :
1980
fDate :
4/1/1980 12:00:00 AM
Firstpage :
288
Lastpage :
299
Abstract :
Given any combinational, internal fan-out-free network and any complete single fault detection test set (SFDTS) for the network, we consider in this paper the problem of determining the minimal extent to which that SFDTS will cover multiple faults in the network. The basis of our approach is the development of a generic perspective to multiple faults which uses a representation of such faults called an L-expression. This perspective leads to a technique for obtaining the greatest lower bound on the multiple fault coverage capability of an SFDTS by means of a simple table look-up process. In addition to generalizing previously known results regarding multiple fault coverage, two particularly interesting results obtained from this approach are as follows: 1) On the average, every SFDTS for an internal fan-out-free network covers 92 percent of all multiple faults of sizes 8 and less. 2) On the average, every SFDTS for an internal fan-out-free network covers at least 46.1 percent of all multiple faults.
Keywords :
Coverage bounds; L-expressions; coverage table; fault vectors; generic representations; internal fan-out-free networks; single and multiple fault detection; Circuit faults; Combinational circuits; Electrical fault detection; Fault detection; Helium; Large scale integration; Logic design; Registers; Sequential circuits; Testing; Coverage bounds; L-expressions; coverage table; fault vectors; generic representations; internal fan-out-free networks; single and multiple fault detection;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1980.1675567
Filename :
1675567
Link To Document :
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