Title :
Guest Editors´ Introduction: The Status of IEEE Std 1500—Part 2
Author :
Marinissen, Erik Jan ; Zorian, Yervant
Author_Institution :
IMEC
Abstract :
In this issue, IEEE Design and Test presents Part 2 of the status of IEEE Std 1500, with three articles concluding our double special issue.
Keywords :
Automatic testing; Electronic design automation and methodology; Hardware; Logic design; Logic testing; Production; Standardization; Tellurium; Test data compression; Very large scale integration; IEEE Design and Test; IEEE Std 1500 Part 2;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.60
