DocumentCode
1142165
Title
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
Author
Savir, Jacob
Author_Institution
IBM T. J. Watson Research Center
Issue
5
fYear
1980
fDate
5/1/1980 12:00:00 AM
Firstpage
410
Lastpage
416
Abstract
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection.
Keywords
Error latency; intermittent fault detection; irredundant circuit; maximum likelihood estimator; random testing; Autocorrelation; Circuit faults; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Equations; Fault detection; Thermal pollution; Vibrations; Error latency; intermittent fault detection; irredundant circuit; maximum likelihood estimator; random testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1980.1675595
Filename
1675595
Link To Document