Title :
Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories
Author :
Suk, Dong S. ; Reddy, Sudhakar M.
Author_Institution :
Bell Laboratories
fDate :
6/1/1980 12:00:00 AM
Abstract :
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
Keywords :
Pattern-sensitive faults; semiconductor random- access memories; Cities and towns; Design methodology; Fault detection; Fault diagnosis; Random access memory; Read-write memory; Semiconductor device testing; Semiconductor memory; Pattern-sensitive faults; semiconductor random- access memories;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675601
