• DocumentCode
    1142255
  • Title

    Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS

  • Author

    Kim, Hyung-Ock ; Lee, Bong Hyun ; Kim, Jong-Tae ; Choi, Jung Yun ; Choi, Kyu-Myung ; Shin, Youngsoo

  • Author_Institution
    Samsung Electron., Yongin, South Korea
  • Volume
    18
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    505
  • Lastpage
    509
  • Abstract
    Power-gating has been widely used to reduce subthreshold leakage current. However, the extent of leakage saving through power-gating diminishes with technology scaling due to gate leakage of data-retention circuit elements. Furthermore, power-gating involves substantial increase of area and wirelength. A circuit technique called supply switching with ground collapse (SSGC) has recently been proposed to overcome the limitation of power-gating. The circuit technique is successfully applied to the register file of ARM9 microprocessor in a 1.2 V, 65-nm CMOS process, and the measured result is reported for the first time. The leakage current is reduced by a factor of 960 on average of 83 dies at 25??C , and by a factor of 150 at 85??C. Compared to a register file implemented in conventional power-gating, leakage current is cut by a factor of 2.2, demonstrating that SSGC can be a substitute for power-gating in nanometer CMOS.
  • Keywords
    CMOS integrated circuits; leakage currents; microprocessor chips; ARM9 microprocessor; CMOS; data-retention circuit element; ground collapse; low-leakage register files; power-gating; size 65 nm; subthreshold leakage current; supply switching; temperature 25 C; temperature 85 C; voltage 1.2 V; Leakage; low-power; power gating; register file; standard cell;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2012429
  • Filename
    5169828