• DocumentCode
    1142309
  • Title

    Identification of Delay Measurable PDFs Using Linear Dependency Relationships

  • Author

    Flanigan, Edward ; Tragoudas, Spyros

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
  • Volume
    18
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1011
  • Lastpage
    1015
  • Abstract
    Recently several methods have been presented to measure the delay of a small set of path delay faults (PDFs), known as a basis set which is used to compute the delays of PDFs. All methods assume that the basis consists of strong robustly tested PDFs because their delays can be measured. This paper presents procedures to identify measurable PDFs whose delays otherwise could not be measured by traditional strong robust sensitization. Path measurement techniques that conditer the bounded delay model allow us to compute the delays of almost all PDFs in existing benchmarks.
  • Keywords
    delays; fault diagnosis; integrated circuit design; delay measurable PDF; linear dependency relationships; path delay faults; path measurement technique; Bounded delay; path delay faults (PDF); strong robust;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2017541
  • Filename
    5169838