DocumentCode :
1142324
Title :
Measures of the Effectiveness of Fault Signature Analysis
Author :
Smith, James E.
Author_Institution :
University of Wisconsin-Madison
Issue :
6
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
510
Lastpage :
514
Abstract :
A linear feedback shift register can be used to compress a serial stream of test result data. The compressed erroneous bit stream caused by a fault is said to form the "signature" of the fault. Since the bit stream is compressed, however, it is possible for an erroneous bit stream and the correct one to result in the same signature.
Keywords :
Data compression; dependent errors; fault detection; fault signature; linear feedback shift registers; Circuit faults; Circuit testing; Compression algorithms; Computer errors; Data compression; Digital systems; Electrical fault detection; Fault detection; Linear feedback shift registers; System testing; Data compression; dependent errors; fault detection; fault signature; linear feedback shift registers;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1980.1675610
Filename :
1675610
Link To Document :
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