DocumentCode
1142372
Title
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor
Author
Crouzet, Y. ; Landrault, C.
Author_Institution
Laboratoire d´´Automatique et d´´Analyse des Systemes du CNRS
Issue
6
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
532
Lastpage
537
Abstract
Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.
Keywords
Coding; fault detection; self-checking; self-checking LSI circuits; Circuit faults; Costs; Digital integrated circuits; Digital systems; Electrical fault detection; Fault detection; Integrated circuit interconnections; Large scale integration; Logic; Microprocessors; Coding; fault detection; self-checking; self-checking LSI circuits;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1980.1675615
Filename
1675615
Link To Document