Title :
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor
Author :
Crouzet, Y. ; Landrault, C.
Author_Institution :
Laboratoire d´´Automatique et d´´Analyse des Systemes du CNRS
fDate :
6/1/1980 12:00:00 AM
Abstract :
Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.
Keywords :
Coding; fault detection; self-checking; self-checking LSI circuits; Circuit faults; Costs; Digital integrated circuits; Digital systems; Electrical fault detection; Fault detection; Integrated circuit interconnections; Large scale integration; Logic; Microprocessors; Coding; fault detection; self-checking; self-checking LSI circuits;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675615
