Title :
Multivalued I2L Circuits for TSC Checkers
Author :
Etiemble, Daniel
Author_Institution :
Institut de Programmation, Universite Pierre et Marie Curie
fDate :
6/1/1980 12:00:00 AM
Abstract :
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
Keywords :
Error-detecting codes; I; multivalued logic; totally self-checking checkers; totally self-checking comparator; Built-in self-test; Circuit faults; Degradation; Logic; Mirrors; Switches; Switching circuits; Voltage; Error-detecting codes; I; multivalued logic; totally self-checking checkers; totally self-checking comparator;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675616
