• DocumentCode
    1142381
  • Title

    Multivalued I2L Circuits for TSC Checkers

  • Author

    Etiemble, Daniel

  • Author_Institution
    Institut de Programmation, Universite Pierre et Marie Curie
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    537
  • Lastpage
    540
  • Abstract
    We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
  • Keywords
    Error-detecting codes; I; multivalued logic; totally self-checking checkers; totally self-checking comparator; Built-in self-test; Circuit faults; Degradation; Logic; Mirrors; Switches; Switching circuits; Voltage; Error-detecting codes; I; multivalued logic; totally self-checking checkers; totally self-checking comparator;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675616
  • Filename
    1675616
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1142381