DocumentCode :
1142495
Title :
Unipolar Resistive Switch Based on Silicon Monoxide Realized by CMOS Technology
Author :
Zhang, Lijie ; Huang, Ru ; Gao, Dejin ; Wu, Dake ; Kuang, Yongbian ; Tang, Poren ; Ding, Wei ; Wang, Albert Z H ; Wang, Yangyuan
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Volume :
30
Issue :
8
fYear :
2009
Firstpage :
870
Lastpage :
872
Abstract :
In this letter, a reliable nonvolatile resistive switching device based on silicon monoxide (SiO) is demonstrated. The device was fabricated with a low-temperature process that can be compatible with a CMOS back-end process and attractive for 3-D memory integration. The fabricated Cu/SiO/W device was found to have a repeatable unipolar resistive switching behavior. The results show excellent on/off resistance ratio (over 104) and good retention performance. The switching mechanism of the device is analyzed by experimental data and probably can be attributed to the behaviors of copper ions in the bulk of SiO under different voltages.
Keywords :
CMOS digital integrated circuits; copper; random-access storage; silicon compounds; tungsten; 3D memory integration; CMOS back-end process; Cu-SiO-W; nonvolatile resistive switching device; unipolar resistive switch; Conduction mechanism; memory; resistive switching; silicon monoxide (SiO);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2009.2024650
Filename :
5169880
Link To Document :
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