• DocumentCode
    1142584
  • Title

    Minimal Redundant Logic for High Reliability and Irredundant Testability

  • Author

    Sutton, John C. ; BRredeson

  • Author_Institution
    Michelin Tire Corporation
  • Issue
    7
  • fYear
    1980
  • fDate
    7/1/1980 12:00:00 AM
  • Firstpage
    648
  • Lastpage
    656
  • Abstract
    The procedures introduced in this paper convert redundant circuits into irredundant circuits for testing purposes. In a redundant circuit, there are redundant connections which contribute no unique l´s or 0´s to the output of the circuit. These redundant connections are contained in the circuit for specific purposes, such as hazard protection, integrated circuit standardization, structural purposes, correct operation in the presence of faults, and other reasons. Most faults on these redundant connections cannot be detected due to the unchanging output. An irredundant circuit contains no redundant connections and all lines are completely testable.
  • Keywords
    Completely testable for single and multiple faults; control inputs and outputs; multilevel fan out free circuits; redundant connections; static logic hazard; triple modular redundancy; Circuit faults; Circuit testing; Electrical fault detection; Hazards; Logic circuits; Logic testing; Protection; Redundancy; Standardization; Terminology; Completely testable for single and multiple faults; control inputs and outputs; multilevel fan out free circuits; redundant connections; static logic hazard; triple modular redundancy;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675636
  • Filename
    1675636