DocumentCode :
1142584
Title :
Minimal Redundant Logic for High Reliability and Irredundant Testability
Author :
Sutton, John C. ; BRredeson
Author_Institution :
Michelin Tire Corporation
Issue :
7
fYear :
1980
fDate :
7/1/1980 12:00:00 AM
Firstpage :
648
Lastpage :
656
Abstract :
The procedures introduced in this paper convert redundant circuits into irredundant circuits for testing purposes. In a redundant circuit, there are redundant connections which contribute no unique l´s or 0´s to the output of the circuit. These redundant connections are contained in the circuit for specific purposes, such as hazard protection, integrated circuit standardization, structural purposes, correct operation in the presence of faults, and other reasons. Most faults on these redundant connections cannot be detected due to the unchanging output. An irredundant circuit contains no redundant connections and all lines are completely testable.
Keywords :
Completely testable for single and multiple faults; control inputs and outputs; multilevel fan out free circuits; redundant connections; static logic hazard; triple modular redundancy; Circuit faults; Circuit testing; Electrical fault detection; Hazards; Logic circuits; Logic testing; Protection; Redundancy; Standardization; Terminology; Completely testable for single and multiple faults; control inputs and outputs; multilevel fan out free circuits; redundant connections; static logic hazard; triple modular redundancy;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1980.1675636
Filename :
1675636
Link To Document :
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