Title :
Testing by Feedback Shift Register
Author_Institution :
Laboratoire d´´Automatique de Grenoble, Institut National Polytechnique de Grenoble
fDate :
7/1/1980 12:00:00 AM
Abstract :
A compact testing method called feedback shift register testing (FSR testing) is presented and its properties, concerning detection and diagnosis, are given. The new notion of distinction potential is introduced. The proposed method is shown to have the maximum resolution and the maximum distinction potential that can be found for an m-bit signature.
Keywords :
Compact testing; FSR testing; distinction potential; fault detection; fault distinction; feedback shift register; resolution; Cascading style sheets; Circuit faults; Circuit testing; Electrons; Feedback; Linear code; Logic testing; Notice of Violation; Sequential circuits; Shift registers; Compact testing; FSR testing; distinction potential; fault detection; fault distinction; feedback shift register; resolution;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675641
