• DocumentCode
    1142686
  • Title

    Simulation of Semiconductor Manufacturing Supply-Chain Systems With DEVS, MPC, and KIB

  • Author

    Huang, Dongping ; Sarjoughian, Hessam S. ; Wang, Wenlin ; Godding, Gary ; Rivera, Daniel E. ; Kempf, Karl G. ; Mittelmann, Hans

  • Author_Institution
    Microsoft, Inc., Redmond, WA
  • Volume
    22
  • Issue
    1
  • fYear
    2009
  • Firstpage
    164
  • Lastpage
    174
  • Abstract
    The dynamics of high-volume discrete-part semiconductor manufacturing supply-chain systems can be described using a combination of Discrete EVent System Specification (DEVS) and model predictive control (MPC) modeling approaches. To formulate the interactions between the discrete process model and its controller, another model called Knowledge Interchange Broker (KIB) is used. A robust and scalable testbed supporting DEVS-based manufacturing process modeling, MPC-based controller design, and the KIBDEVS/MPC interaction model is developed. A suite of experiments have been devised and simulated using this testbed. The flexibility of this approach for modeling, simulating, and evaluating stochastic discrete process models under alternative control schemes is detailed. The testbed illustrates the benefits and challenges associated with developing and using realistic manufacturing process models and process control policies. The simulation environment demonstrates the importance of explicitly defining and exposing the interactions between the manufacturing and control subsystems of complex semiconductor supply-chain systems.
  • Keywords
    discrete event systems; predictive control; semiconductor device manufacture; stochastic processes; supply chains; discrete event system; knowledge interchange broker; model predictive control; semiconductor manufacturing; stochastic discrete process; supply-chain systems; Discrete event systems; Manufacturing processes; Predictive control; Predictive models; Process control; Robust control; Semiconductor device manufacture; Stochastic processes; Testing; Virtual manufacturing; Discrete-event system specification; Knowledge Interchange Broker (KIB); hybrid simulation testbed; model composability; model predictive control; optimization; semiconductor manufacturing; supply-chain management;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2008.2011680
  • Filename
    4773491