Title :
Simulation of Semiconductor Manufacturing Supply-Chain Systems With DEVS, MPC, and KIB
Author :
Huang, Dongping ; Sarjoughian, Hessam S. ; Wang, Wenlin ; Godding, Gary ; Rivera, Daniel E. ; Kempf, Karl G. ; Mittelmann, Hans
Author_Institution :
Microsoft, Inc., Redmond, WA
Abstract :
The dynamics of high-volume discrete-part semiconductor manufacturing supply-chain systems can be described using a combination of Discrete EVent System Specification (DEVS) and model predictive control (MPC) modeling approaches. To formulate the interactions between the discrete process model and its controller, another model called Knowledge Interchange Broker (KIB) is used. A robust and scalable testbed supporting DEVS-based manufacturing process modeling, MPC-based controller design, and the KIBDEVS/MPC interaction model is developed. A suite of experiments have been devised and simulated using this testbed. The flexibility of this approach for modeling, simulating, and evaluating stochastic discrete process models under alternative control schemes is detailed. The testbed illustrates the benefits and challenges associated with developing and using realistic manufacturing process models and process control policies. The simulation environment demonstrates the importance of explicitly defining and exposing the interactions between the manufacturing and control subsystems of complex semiconductor supply-chain systems.
Keywords :
discrete event systems; predictive control; semiconductor device manufacture; stochastic processes; supply chains; discrete event system; knowledge interchange broker; model predictive control; semiconductor manufacturing; stochastic discrete process; supply-chain systems; Discrete event systems; Manufacturing processes; Predictive control; Predictive models; Process control; Robust control; Semiconductor device manufacture; Stochastic processes; Testing; Virtual manufacturing; Discrete-event system specification; Knowledge Interchange Broker (KIB); hybrid simulation testbed; model composability; model predictive control; optimization; semiconductor manufacturing; supply-chain management;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2008.2011680