• DocumentCode
    1142711
  • Title

    Special Section on the 2008 International Conference on Microelectronic Test Structures

  • Author

    Schmitz, Jurriaan

  • Volume
    22
  • Issue
    1
  • fYear
    2009
  • Firstpage
    50
  • Lastpage
    50
  • Abstract
    The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.
  • Keywords
    Circuit testing; Europe; Integrated circuit interconnections; Integrated circuit measurements; Integrated circuit testing; Microelectronics; Physics; Process control; Solid state circuits; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2008.2010725
  • Filename
    4773493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1142711