Title :
Special Section on the International Symposium for Quality Electronic Design 2008 (ISQED 2008)
Author :
Wright, Paul ; De Venuto, Daniela
Abstract :
The five papers in this special section appeared in the International Symposium on Quality Electronic Design 2008 (ISQED-2008), held March 17-19, 2008, in San Jose, CA.
Keywords :
Delay; Design methodology; Electronic design automation and methodology; Integrated circuit technology; Manufacturing processes; Process design; Semiconductor device manufacture; Semiconductor process modeling; Special issues and sections; Timing;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2008.2011625
