Title :
Negabinary A/D Conversion
Author_Institution :
Division of Computing Research, CSIRO
Abstract :
It is shown that A/D conversion to base –2 may be achieved by making minor modifications to a conventional A/D converter.
Keywords :
Analog-digital conversion; negabinary analog-digital conversion; Arithmetic; Circuit faults; Circuit testing; Cities and towns; Counting circuits; Information science; Inverters; Logic testing; Registers; Voltage; Analog-digital conversion; negabinary analog-digital conversion;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675659
