Title :
Test Sets for Combinational Logic—The Edge-Tracing Approach
Author :
Stoffers, Karl E.
Author_Institution :
Department of Electrical and Electronic Engineering, California State University
Abstract :
A method for fault analysis of multilevel combinational logic circuits with single stuck-at-faults is described. It determines the sensitizing input combinations (separating edges) from the output function and then traces their paths from the output toward the inputs. The handling of multiple path sensitization in this approach is much simpler than in other path-tracing techniques. Subscripting of variables is not needed and dead-ending (as encountered in the D-algorithm) cannot occur.
Keywords :
Backward tracing; convergence-point test for multiple paths; no backtracking; no dead-ending; path sensitizing; stuck-at-faults; Circuit faults; Circuit testing; Circuit topology; Combinational circuits; Fault location; Hamming distance; Logic design; Logic testing; Partitioning algorithms; Backward tracing; convergence-point test for multiple paths; no backtracking; no dead-ending; path sensitizing; stuck-at-faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675660
