DocumentCode
1142866
Title
A Remark on the Nonminimality of Certain Multiple Fault Detection Algorithms
Author
Coy, W.
Author_Institution
Department of Informatics, University of Dortmund, Dortmund, West Germany and the Faculty of Mathematics and Informatics, University of Bremen
Issue
8
fYear
1980
Firstpage
757
Lastpage
759
Abstract
Poage has constructed a complex fault detection algorithm which generates a complete and minimal test set of all multiple stuck-at faults of a given combinational network. Several authors have derived from his method fast and simple multiple fault detection algorithms, which are claimed to generate complete test sets with a "near-minimal" or "near-optimal" number of tests. We show that the algorithms by Bossen and Hong and the algorithm by Yang and Yau may generate test sets with an exponential number of tests (relative to the number of inputs) where a linear number of tests is sufficient for a complete multiple fault detection test set.
Keywords
Algorithms; cause-effect analysis; combinational networks; fault detection; fault functions; multiple stuck-at faults; redundant networks; test complexity; test pattern generation; Circuit faults; Circuit testing; Combinational circuits; Detection algorithms; Fault detection; Informatics; Input variables; Mathematics; Pattern analysis; Test pattern generators; Algorithms; cause-effect analysis; combinational networks; fault detection; fault functions; multiple stuck-at faults; redundant networks; test complexity; test pattern generation;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1980.1675666
Filename
1675666
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