• DocumentCode
    1142919
  • Title

    Characterization and modeling of multiple line interconnections from time domain measurements

  • Author

    Hayden, Leonard A. ; Tripathi, Vijai K.

  • Author_Institution
    Microwave and Metrology Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    42
  • Issue
    9
  • fYear
    1994
  • fDate
    9/1/1994 12:00:00 AM
  • Firstpage
    1737
  • Lastpage
    1743
  • Abstract
    Methods have been developed to extract electrical circuit models from time domain measurements of lossless, nonuniform, multiconductor transmission lines for two broad classes of structures. Although unique solutions are not feasible for general structures that scatter the propagating wave-front, approximate solutions have been identified. For the first class of structures a single velocity wave-front is assumed, equivalent to the homogeneous media case. The second class is for structures with identical lines, such as a parallel line bus structure, where separable modal wave-fronts propagate. For these cases the propagation behavior (eigenvector matrix) is determined only by the known number of lines, N, allowing decoupling of the system into N orthogonal modal transmission lines. Circuit models have been developed for these decoupled nonuniform lines, as well as for the equal modal velocity assumption which relies on a matrix impedance profile to fully describe the system
  • Keywords
    eigenvalues and eigenfunctions; microstrip lines; packaging; eigenvector matrix; electrical circuit models; equal modal velocity assumption; homogeneous media; matrix impedance profile; multiconductor transmission lines; multiple line interconnections; orthogonal modal transmission lines; parallel line bus structure; propagating wave-front; propagation behavior; separable modal wave-fronts; single velocity wave-front; time domain measurements; Distributed parameter circuits; Electric variables measurement; Integrated circuit interconnections; Loss measurement; Multiconductor transmission lines; Propagation losses; Scattering; Time measurement; Transmission line matrix methods; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.310582
  • Filename
    310582