Title :
Architecture and statistical model of a pulse-mode digital multilayer neural network
Author :
Kim, Young-Chul ; Shanblatt, Michael A.
Author_Institution :
Dept. of Electron. Eng., Chonnam Nat. Univ., Kwangju, South Korea
fDate :
9/1/1995 12:00:00 AM
Abstract :
A new architecture and a statistical model for a pulse-mode digital multilayer neural network (DMNN) are presented. Algebraic neural operations are replaced by stochastic processes using pseudo-random pulse sequences. Synaptic weights and neuron states are represented as probabilities and estimated as average rates of pulse occurrences in corresponding pulse sequences. A statistical model of error (or noise) is developed to estimate relative accuracy associated with stochastic computing in terms of mean and variance. The stochastic computing technique is implemented with simple logic gates as basic computing elements leading to a high neuron-density on a chip. Furthermore, the use of simple logic gates for neural operations, the pulse-mode signal representation, and the modular design techniques lead to a massively parallel yet compact and flexible network architecture, well suited for VLSI implementation. Any size of a feedforward network can be configured where processing speed is independent of the network size. Multilayer feedforward networks are modeled and applied to pattern classification problems such as encoding and character recognition
Keywords :
VLSI; character recognition; encoding; feedforward neural nets; neural chips; neural net architecture; parallel architectures; pattern classification; probability; statistical analysis; VLSI implementation; architecture; character recognition; encoding; feedforward network; logic gates; pattern classification; pseudo-random pulse sequences; pulse sequences; pulse-mode digital multilayer neural network; pulse-mode signal representation; statistical error model; synaptic weights; Logic design; Logic gates; Multi-layer neural network; Neural networks; Neurons; Probability; Signal representations; State estimation; Stochastic processes; Stochastic resonance;
Journal_Title :
Neural Networks, IEEE Transactions on