• DocumentCode
    1143158
  • Title

    Packaging of Surface Micromachined Thin Film Thermocouples (TFT): Comparison of the Resistance Arc Microwelding Technique With Wire Bonding

  • Author

    Sinha, Nipun ; Ahn, Hee Seok ; Williams, Randall ; Banerjee, Debjyoti

  • Author_Institution
    Mech. Eng. Dept., Univ. of Pennsylvania, Philadelphia, PA, USA
  • Volume
    32
  • Issue
    2
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    252
  • Lastpage
    260
  • Abstract
    In this paper, we report the packaging of thin film thermocouples (TFT) using resistance arc welding technique. Parallel gap welding and spot welding have been reported in the literature for attaching thin wires to metal thin films. To the knowledge of the authors, this is the first time resistance arc welding has been reported as a packaging technique for microfabricated devices. A brief description of the microfabrication process and chemical analysis using X-ray photoelectron spectroscopy (XPS) of the vapor deposited alloy constituents for the TFT are reported in this study. K-type (chromel and alumel) thermocouple wires were used as targets for physical vapor deposition of the component layers of the TFT. The calibration of the TFT using high-speed data acquisition is reported. The calibration curves of TFT packaged using ultrasonic wire bonding of Al wires are compared with TFT packaged using resistance arc welding of K-type thermocouple wires. TFT packaged using resistance arc welding is found to have better temperature response under steady-state conditions.
  • Keywords
    X-ray photoelectron spectra; arc welding; electronics packaging; lead bonding; micromachining; resistance welding; thermocouples; thin film devices; ultrasonic bonding; K-type thermocouple wires; X-ray photoelectron spectroscopy; calibration; chemical analysis; microfabrication; packaging; physical vapor deposition; resistance arc microwelding; surface micromachining; thin film thermocouples; ultrasonic wire bonding; Bonding; Calibration; Chemical analysis; Joining processes; Packaging; Spot welding; Surface resistance; Thermal resistance; Thin film transistors; Wire; Interconnects; X-ray photoelectron spectroscopy (XPS); resistance arc welding; thin film thermocouples (TFTs); wire bonding;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2009.2013982
  • Filename
    5169990