Title :
Hierarchical Finite-Element Reduction-Recovery Method for Large-Scale Transient Analysis of High-Speed Integrated Circuits
Author :
Gan, Houle ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
This paper proposes a hierarchical finite-element reduction-recovery method for large-scale transient analysis of high-speed integrated circuits. This method rigorously reduces the matrix of a multilayer system of O(N) to that of a single-cell system of O(1) regardless of the original problem size. More important, the matrix reduction is achieved analytically, and hence the CPU and memory overheads are minimal. In addition, the reduction preserves the sparsity of the original system matrix. As a result, the matrix factorization cost is reduced to O(1) by the proposed method. The CPU cost at each time step scales linearly with the number of unknowns. The method is applicable to any Manhattan-type integrated circuit embedded in layered dielectric media. Numerical and experimental results demonstrate the performance of the proposed method.
Keywords :
dielectric devices; finite element analysis; high-speed integrated circuits; matrix decomposition; transient analysis; CPU; Manhattan-type integrated circuit; hierarchical finite-element reduction-recovery method; high-speed integrated circuits; large-scale transient analysis; layered dielectric media; matrix factorization; matrix reduction; memory overheads; multilayer system; Electromagnetics; finite-element method; integrated circuits; large-scale analysis; time domain; transient analysis;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2009.2019844