• DocumentCode
    1143249
  • Title

    Single-shot, repetitive, and lifetime high-voltage testing of capacitors

  • Author

    Shkuratov, Sergey I. ; Talantsev, Evgueni F. ; Hatfield, Lynn L. ; Dickens, James C. ; Kristiansen, Magne

  • Author_Institution
    Dept. of Electr. & Comput. Eng. & Phys., Texas Tech Univ., Lubbock, TX, USA
  • Volume
    30
  • Issue
    5
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1943
  • Lastpage
    1949
  • Abstract
    Four different types of capacitors have been tested to determine the maximum usable high voltage. Ceramic, drop-dipped film, molded-mylar tubulars, and polyester/foil capacitors of different values and different nominal voltages were tested in four modes: the single-shot mode, the repetitive mode, the lifetime dc voltage mode, and the group mode. Experiments have shown that the breakdown voltage for all types of the capacitors tested is ten to seventeen times higher than the nominal voltage. The energy stored in the capacitors for a short time under overstress conditions is from 100 to 250 times higher their normal energy. Data are given for the limitations for single capacitors, and for two, three, and four capacitors connected in parallel.
  • Keywords
    ceramic capacitors; foils; high-voltage techniques; impulse testing; life testing; polymers; power capacitors; pulsed power supplies; thin film capacitors; breakdown voltage; capacitors testing; ceramic capacitors; drop-dipped film capacitors; energy storage; group mode; lifetime DC voltage mode; lifetime high-voltage testing; maximum usable high voltage; molded-mylar tubular capacitors; normal energy; overstress conditions; polyester/foil capacitors; repetitive testing; single-shot testing; thin-film capacitors; Capacitors; Ceramics; Current measurement; Electronic components; Life testing; Manufacturing; Probes; Resistors; System testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.806628
  • Filename
    1178233