Title : 
Electrooptic measurement of 500-kV pulsed voltages
         
        
            Author : 
Shah, Rishi D. ; Cliffe, Robert J. ; Smith, Ivor R. ; Novac, Bucur M. ; Senior, Peter
         
        
            Author_Institution : 
Dept. of Electron. & Electr. Eng., Loughborough Univ., UK
         
        
        
        
        
            fDate : 
10/1/2002 12:00:00 AM
         
        
        
        
            Abstract : 
This paper describes a voltage probe in which the electrooptic Pockels effect is used in the measurement of ultrafast 500 kV pulses. Electrical isolation is provided between the high-voltage and the measurement circuits, and the probe is suitable for use in many applications where more conventional techniques are inapplicable. A special-purpose capacitive voltage divider attenuates the 500 kV to a level acceptable by the crystal of a Pockels cell. The attenuated voltage then modulates light from a laser system passing through the crystal, with the emerging signal being converted into electrical form and fed to a digital storage oscilloscope to provide a very accurate recording proportional to the divider input voltage. Experimental results confirm both the very fast response of the probe and its high-voltage capability.
         
        
            Keywords : 
Pockels effect; attenuators; capacitors; digital storage oscilloscopes; electro-optical modulation; measurement by laser beam; probes; pulse measurement; voltage dividers; voltage measurement; 500 kV; Pockels cell crystal; capacitive voltage divider attenuator; digital storage oscilloscopes; electrical isolation; electrooptic Pockels effect; electrooptic measurement; laser light modulation; measurement circuits; probe fast response time; ultrafast high voltage pulse measurement; voltage probes; Circuit testing; Current measurement; Digital modulation; Electric variables measurement; Electromagnetic measurements; Electromagnetic transients; Optical modulation; Probes; Pulse measurements; Voltage;
         
        
        
            Journal_Title : 
Plasma Science, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPS.2002.805322