• DocumentCode
    1143259
  • Title

    Electrooptic measurement of 500-kV pulsed voltages

  • Author

    Shah, Rishi D. ; Cliffe, Robert J. ; Smith, Ivor R. ; Novac, Bucur M. ; Senior, Peter

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Loughborough Univ., UK
  • Volume
    30
  • Issue
    5
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1950
  • Lastpage
    1954
  • Abstract
    This paper describes a voltage probe in which the electrooptic Pockels effect is used in the measurement of ultrafast 500 kV pulses. Electrical isolation is provided between the high-voltage and the measurement circuits, and the probe is suitable for use in many applications where more conventional techniques are inapplicable. A special-purpose capacitive voltage divider attenuates the 500 kV to a level acceptable by the crystal of a Pockels cell. The attenuated voltage then modulates light from a laser system passing through the crystal, with the emerging signal being converted into electrical form and fed to a digital storage oscilloscope to provide a very accurate recording proportional to the divider input voltage. Experimental results confirm both the very fast response of the probe and its high-voltage capability.
  • Keywords
    Pockels effect; attenuators; capacitors; digital storage oscilloscopes; electro-optical modulation; measurement by laser beam; probes; pulse measurement; voltage dividers; voltage measurement; 500 kV; Pockels cell crystal; capacitive voltage divider attenuator; digital storage oscilloscopes; electrical isolation; electrooptic Pockels effect; electrooptic measurement; laser light modulation; measurement circuits; probe fast response time; ultrafast high voltage pulse measurement; voltage probes; Circuit testing; Current measurement; Digital modulation; Electric variables measurement; Electromagnetic measurements; Electromagnetic transients; Optical modulation; Probes; Pulse measurements; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.805322
  • Filename
    1178234