Introduction

THIS IS the first Special Issue of the IEEE TRANSACTIONS on Design for Testability, jointly sponsored by the IEEE Computer Society and the IEEE Circuits and Systems Society. Both of these organizations have had a continuing interest in this topic, as demonstrated by the publication of papers in their respective TRANSACTIONS, and by their support of such workshops as CANDE and the IEEE Workshop on Design for Testability. In view of this interest, it was natural for the two Societies to cooperate in the sponsorship of a Special TRANSACTIONS Issue.